WIn engineering and its various subdisciplines, acceptance testing is a test conducted to determine if the requirements of a specification or contract are met. It may involve chemical tests, physical tests, or performance tests.
WAutomatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.
WBead probe technology (BPT) is technique used to provide electrical access to printed circuit board (PCB) circuitry for performing in-circuit testing (ICT). It makes use of small beads of solder placed onto the board's traces to allow measuring and controlling of the signals using a test probe. This permits test access to boards on which standard ICT test pads are not feasible due to space constraints.
WBoundary scan is a method for testing interconnects on printed circuit boards or sub-blocks inside an integrated circuit. Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit.
WBurn-in is the process by which components of a system are exercised prior to being placed in service. This testing process will force certain failures to occur under supervised conditions so an understanding of load capacity of the product can be established.
WDUT boards are used in automated integrated circuit testing where the term DUT stands for device under test, referring to the circuit being tested.
WAn ESD simulator, also known as an ESD gun, is a handheld unit used to test the immunity of devices to electrostatic discharge (ESD). These simulators are used in special electromagnetic compatibility (EMC) laboratories. ESD pulses are fast, high-voltage pulses created when two objects with different electrical charges come into close proximity or contact. Recreating them in a test environment helps to verify that the device under test is immune to static electricity discharges.
WMixed flowing gas (MFG) is a type of laboratory environmental testing for products, particularly electronics, to evaluate resistance to corrosion due to gases in the atmosphere. Mixed Flowing Gas (MFG) test is a laboratory test in which the temperature (°C), relative humidity (%RH), concentration of gaseous pollutants, and other critical variables are carefully defined, monitored and controlled. The purpose of this test is to simulate corrosion phenomenon due to atmospheric exposure. The electronic product is exposed to gases such as chlorine, hydrogen sulfide, nitrogen dioxide, and sulfur dioxide at levels in the parts per billion range, in a controlled environmental chamber. Test samples that have been exposed to MFG testing have ranged from bare metal surfaces, to electrical connectors, and to complete assemblies. In regards to noble metal plated connector applications, MFG testing has been widely accepted as a qualification test method to evaluate the performance of these connectors.
WA USB Killer is a device that looks similar to a USB thumb drive that sends high-voltage power surges into the device it is connected to, which can damage hardware components. Its manufacturers claim the device has been designed to test components for protection from power surges and electrostatic discharge; however, there have been several instances of malicious use, and the device is not used for device testing by any major company. The device is often mentioned in articles warning readers against plugging in unknown USB drives.